Near Infrared Emission from Defect States of Atomically Thin Phosphorene
Abstract
We demonstrate a new class of near infrared localized defects in few layer phosphorene. This work highlights the significance of defect states of phosphorene for near infrared optoelectronic applications.
Publication Details
- Authors
- Publication Type
- Conference Paper
- Year of Publication
- 2017
- Publisher
- Optica Publishing Group
- Pagination
- SW4K.4